Rietveld refinement of diffraction data for crystalline materials
Rietveld refinement is a technique for the characterisation of crystalline materials, using their neutron and x-ray diffraction patterns (diffractograms). The analysis of the height, width and position of the measured reflections, and corresponding intensity peaks, are used to determine the material’s structure (crystallinity, crystallite shape, density, unit cell dimensions, atomic coordinates and bonds lengths and angles) and reconstruct its unit cell. Other parameters that can be modelled are micro strain in crystal lattice, texture, and vacancies.
The Rietveld method is a powerful technique, with diverse applications and experimental options in the fields of materials, nanomaterials and advanced materials.
The NanoCommons Transnational Access (TA) is the ability of nanosafety researchers from industry, academia and regulatory bodies to access the state-of-the-art NanoCommons expertise free of charge and take advantage of the NanoCommons services, facilities and knowledge to advance their work, solve problems and take their research to the next level.Back to all services