NanoImage TEM Image Analysis Tool
NanoImage, part of the Jaqpot Platform, offers tools for analysis of electron microscopy images, allowing the user to derive descriptors for the materials directly from the images, offering distinct advantage over manual procedures, in terms of speed and ability to represent the whole sample. It simplifies the workload for microscope operators by automating procedures to capture measurements that express the frequency of occurrence of materials with certain dimensions/shapes or the presence of materials with outlier dimensions/shapes. The foundation of the application is the popular open source ImageJ software, used extensively within the research community, which the UPCI team made available as a web application. For Spherical particles, apart from the descriptors derived from ImageJ, we offer additional descriptors (porosity, sphericity, surface diameter, equivalent volume to surface, equivalent volume diameter). For Carbon Nanotubes, we currently offer width calculations, while other descriptor services are being developed. We welcome comments on the efficacy of NanoImage on other elongated structures, such as wires, nanowires or nanorods.
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